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Products-KLA YieldStar

Empowering Tomorrow's Innovations: KLA YieldStar Solutions and Support

Driving Technological Advancements

KLA YieldStar, a part of KLA Advance, stands at the forefront of technological innovation, empowering the development of tomorrow's groundbreaking technologies. With a strong emphasis on collaborating with pioneering technology companies, KLA YieldStar plays a vital role in ensuring that the ideas of today translate into the realities of tomorrow. Whether it's the intricate workings of a driverless car, the immersive experience of virtual reality, or the precision of factory robotics, KLA YieldStar transforms theoretical concepts into tangible possibilities. Its tools and systems are instrumental in the creation of technological devices that shape our current lives and will define the future.

Enabling Industry Transformation

KLA YieldStar is deeply committed to advancing humanity through its cutting-edge solutions. The company's impact extends across various industries, including automotive, mobile, and data centers, where its advanced inspection tools, metrology systems, and computational analytics pave the way for accelerated progress. By enabling evolution and innovation in the data era, KLA YieldStar drives significant transformation, propelling industries forward into a new era of technological excellence. Through collaborations with key industry players and a focus on operational excellence, KLA YieldStar ensures that its solutions remain at the forefront of innovation and industry advancement.

Commitment to Excellence and Collaboration

KLA YieldStar's dedication to excellence is evident in its investment in research and development, with a substantial portion of its sales reinvested into solving complex technical challenges. From pioneering mask inspection tools to revolutionary broadband plasma technology, KLA YieldStar has consistently led the way in semiconductor process control and defect discovery. The company's commitment to collaboration further amplifies its impact, as active partnerships at strategic, technical, and operational levels foster agile thinking, maximize discovery, and drive innovative solutions. By combining deep scientific expertise with an optimistic outlook, KLA YieldStar continues to drive significant advancements and shape the future of technology.

Global Footprint and Social Responsibility

With a global presence spanning multiple regions and over 15,000 employees, KLA YieldStar values diversity, communication, and global collaboration as catalysts for innovation. The company's commitment to social responsibility is reflected in its support for community initiatives, STEM education, health programs, and disaster relief efforts. By sponsoring organizations like the Second Harvest Food Bank and contributing to global causes like combatting river blindness in Africa, KLA YieldStar demonstrates its dedication to making a positive impact on humanity. Through its emphasis on environmental, social, and governance practices, KLA YieldStar remains steadfast in its mission to advance humanity through technology and innovation.

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Enhancing IC Component Inspection and Metrology with KLA YieldStar

Advanced Optical Inspection with ICOS™ T3/T7 Series

KLA’s ICOS™ T3/T7 Series offers advanced options for fully automated optical inspection of packaged integrated circuit (IC) components, whether they come in trays (T3) or tapes (T7) output. These systems are designed to provide heightened sensitivity to small defect types while ensuring accurate and repeatable 3D metrology measurements, crucial for detecting issues that could impact the final package quality. By incorporating Artificial Intelligence (AI) systems with deep learning algorithms, the ICOS T3/T7 Series can smartly categorize different defect types, aiding in efficient and precise component sorting.

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KLA YieldStar: Revolutionizing Semiconductor Software Solutions

Klarity® Automated Defect and Yield Data Analysis

KLA's Klarity® Defect system provides real-time excursion identification, automating defect analysis to accelerate yield learning cycles. Klarity® SSA enhances defect classification, aiding in process issue detection. Klarity® ACE XP enables yield sharing across fabs for faster yield acceleration. These systems support lot dispositioning, defect source analysis, and excursion notifications, reducing inspection, classification, and review data workload.

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Optimizing PCB and IC Substrate Manufacturing with KLA YieldStar Chemistry Process Control

Enhancing Plating and Coating Chemistries

KLA's chemistry process control products, including the KLA YieldStar, play a vital role in optimizing various processes within the printed circuit board (PCB) and IC substrate manufacturing environments. These products facilitate the analysis and monitoring of plating and coating chemistries, ensuring the highest quality outcomes. Through the utilization of a patented cyclic voltametric stripping (CVS) technique, the KLA YieldStar effectively analyzes PCB plating baths, providing crucial insights to support optimal plating processes.

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Revolutionizing Solder Mask Imaging with KLA YieldStar Direct Imaging Solutions

Highly Accurate Direct Imaging for Solder Mask Applications

KLA's direct imaging (DI) solutions for solder mask (SM) go beyond traditional imaging techniques to offer high-accuracy, high-quality imaging with impressive production throughput capabilities. These cutting-edge solutions cater to a wide range of solder mask designs, from simple to highly complex configurations. Whether it's high-density interconnects (HDI), multi-layer boards (MLB), flexible printed circuit boards (FPCB), or specialized white solder mask applications like miniLED backlight units, KLA's solutions ensure consistently precise imaging quality at a low total cost of ownership.

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Maximizing Chip Manufacturing Efficiency with KLA YieldStar Metrology Solutions

Archer™ Overlay Metrology Systems

KLA's Archer™ 750 overlay metrology system offers precise on-product overlay error feedback, crucial for achieving fast technology ramps and stable production of cutting-edge memory and logic devices. With wavelength tunability and 10nm resolution, this system ensures accurate overlay error measurements even in the presence of production process variations. The advanced algorithms and rAIM® overlay target design enhance the correlation between target and device overlay errors, enabling lithographers to accurately track device overlay performance.

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